MEMaterial, the most comprehensive thin-film materials knowledge base available today, provides a vital link between the process parameters and the device behavior. Use MEMaterial as an organization-wide database, knowledge repository, or as a tool to optimize processes in your fab.
Thin film database
As the most comprehensive thin-film materials knowledge database and process optimization tool available today, MEMaterial provides a vital link between process parameters and device behavior. Introduced in 1993 and continuously updated, MEMaterial was the first software product to address the lack of thin-film material information. Linking actual fabrication machine settings to thin-film material properties marked a major milestone in the development of MEMS. By providing insight into the behavior of materials, MEMaterial helps eliminate the trial and error fabrication runs previously used to analyze material behavior.
MEMaterial allows you to predict mechanical, electrical, thermal, optical and other material properties as a function of processing parameters. MEMaterial is based on measured data, rather than constitutive relationships. It contains an extensive database, which you can expand with your own proprietary data. Providing more than 70 processes, MEMaterial is the most comprehensive database of thin-film material properties.
Model with confidence
Accurate material properties are vital to creating accurate device models. You may have the most sophisticated device model, but your efforts will be for naught if your material properties are inaccurate. So, if you are serious about MEMS design, MEMaterial is absolutely essential for your needs.
MEMaterials proprietary estimation and optimization routine which has been extensively tested and proven accurate computes material properties for any given combination of parameters based on measured process data. This method for determining material properties effectively reduces the inter-machine dependencies often noted for thin film depositions.
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Convert your process data into information that you can use. MEMaterials advanced multi-variate data-mining routines allow you to quickly convert process information into trends that you can visualize. This realtime data can provide your design engineers a good insight into material properties. Click picture to enlarge.
Optimize your processes with ease
Process characterization is a time consuming, but MEMaterial allows you to cut your experimentation time significantly. You can use our patented multi-variate optimization routines to gain insight into how your machine parameters, such as carrier gas partial pressures or RF power, affect thin film properties like Youngs modulus and the refractive index. In addition, youll be able to expand the databases to include your companys own proprietary information.
The bottom line on MEMaterial? Our process optimization routines allow you to cull through your data and predict material properties accurately and easily. What else can you ask for?